Conference paper
Delay chain based programmable jitt+er generator
Tian Xia, Peilin Song, et al.
ETS 2004
In recent years, innovative applications based on the detection of emission sources such as the light emission from off-state leakage current (LEOSLC) of CMOS transistors have been developed for testing and diagnosing modern ultralarge-scale integration circuits. In this paper, we show that LEOSLC can be used to effectively debug circuits, localize defects with a quick turn around time, read the logic state of gates, and extract the internal voltage drop of power distribution grids among others. © 2004 IEEE.
Tian Xia, Peilin Song, et al.
ETS 2004
Franco Stellari, Peilin Song, et al.
IEEE ITC 2006
Franco Stellari, Peilin Song, et al.
ISTFA 2002
Chung-Ching Lin, Franco Stellari, et al.
ISTFA 2013