The electronic structure of impurities and defects in SiO2

Sokrates T. Pantelides

doi:10.1016/0040-6090(82)90489-8

Thin Solid Films

Paper

05 Mar 1982

The electronic structure of impurities and defects in SiO₂

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Abstract

We describe a simple tight-binding model which gives qualitative understanding and quantitative estimates of the electronic energy levels of several classes of impurities, defects and impurity complexes in SiO2. © 1982.

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