P.E. Batson
Ultramicroscopy
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
P.E. Batson
Ultramicroscopy
Xudong Weng, Peter Rez, et al.
Solid State Communications
P.E. Batson
Physica B: Condensed Matter
D. Cherns, D.A. Smith, et al.
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties