S. Subramanian, D.A. Muller, et al.
Materials Science and Engineering A
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
S. Subramanian, D.A. Muller, et al.
Materials Science and Engineering A
P.E. Batson
Ultramicroscopy
P.E. Batson
M&M 2006
P.E. Batson, J.M. Gibson, et al.
Journal of Non-Crystalline Solids