J.A. Van Vechten, W. Solberg, et al.
Journal of Crystal Growth
The system of computer control of STEM operation for EELS acquisition is described. The ability to obtain analytical information from 1 nm sized areas during a 15 min integration time is illustrated. The system of hardware and software is discussed in general terms to highlight the organizational philosophy which allows complex and adaptable behavior with a minimum of construction effort. © 1982.
J.A. Van Vechten, W. Solberg, et al.
Journal of Crystal Growth
R.A. Kiehl, P.E. Batson, et al.
Physical Review B
P.E. Batson
Physical Review B
P.E. Batson
Ultramicroscopy