David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
David W. Jacobs, Daphna Weinshall, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence
David L. Shealy, John A. Hoffnagle
SPIE Optical Engineering + Applications 2007
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering