The problem of Sr doping and interface abruptness in La_2-xSr_xCuO₄ multilayers; the application of transmission electron microscopy

This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La2-xSrxCuO4 thin films grown by molecular beam epitaxy on (001) strontium titanate substrates. © 1994.