Michiel Sprik
Journal of Physics Condensed Matter
This represents an attempt to use the local investigative properties of transmission electron microscopy to examine the content and distribution of strontium in La2-xSrxCuO4 thin films grown by molecular beam epitaxy on (001) strontium titanate substrates. © 1994.
Michiel Sprik
Journal of Physics Condensed Matter
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Mark W. Dowley
Solid State Communications
John G. Long, Peter C. Searson, et al.
JES