Sung Ho Kim, Oun-Ho Park, et al.
Small
Using time-resolved luminescence we measure the energy relaxation of excitons in thin quantum wells. We find that the excitons relax by losing potential energy in a drift-diffusion motion driven by potential fluctuations in the quantum well plane, which are longer than the coherence length of the excitons. For a constant interface quality the coherence length strongly decreases with decreasing well width so that drift-diffusion dominates the exciton relaxation in thin quantum wells. © 1992.
Sung Ho Kim, Oun-Ho Park, et al.
Small
K.A. Chao
Physical Review B
T.N. Morgan
Semiconductor Science and Technology
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications