Skip to main content
Research
Focus areas
Blog
Publications
Careers
About
Back
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Back
About
Overview
Labs
People
Back
Semiconductors
Back
Artificial Intelligence
Back
Quantum Computing
Back
Hybrid Cloud
Back
Overview
Back
Labs
Back
People
Research
Focus areas
Semiconductors
Artificial Intelligence
Quantum Computing
Hybrid Cloud
Blog
Publications
Careers
About
Overview
Labs
People
Open IBM search field
Close
Ultramicroscopy
Paper
01 Jan 1978
Thin film x-ray spectrometry
View publication
Abstract
No abstract available.
Related
Paper
Resolution and Linewidth Tolerances in Electron Beam and Optical Projection Lithography
Paper
The role of AsF
5
in modifying the electrical properties of polyacetylene, (CH)
x
Paper
Energy deposition functions in electron resist films on substrates
Paper
'Organic metals': polypyrrole, a stable synthetic 'metallic' polymer
View all publications