Conference paper
CMOS in the new millenium
T.H. Ning
CICC 2000
Paper
TP-A1 Shallow-Level Electron Traps in SiO2
Abstract
No abstract available.
Related
Conference paper
ON THE IMPURITY PROFILES OF DOWN SCALED BIPOLAR TRANSISTORS.
D.D. Tang, G.P. Li, et al.
IEDM 1985
C.C.-H. Hsu, L.K. Wang, et al.
Journal of Electronic Materials
T.C. Chen, E. Ganin, et al.
IEEE T-ED