Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Time-resolved magneto-optical Kerr techniques are employed to study optically induced ultrafast modulation in an antiferromagnetic (AF) exchange biased ferromagnetic (FM) thin epitaxial bilayer (NiFe/NiO). The interface region between the antiferromagnetic NiO and coupled ferromagnetic NiFe layers is photoexcited with femtosecond laser pulses, following which the transient magneto-optical response of the NiFe layer is measured. When compared with optically induced effects on “bare” epitaxial NiFe thin films, we observe a large enhancement to the transient Kerr effect in the exchange biased bilayers, interpreted as a modulation of the AF/FM exchange coupling on a picosecond timescale. © 1998 The American Physical Society.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Frank Stem
C R C Critical Reviews in Solid State Sciences
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
T. Schneider, E. Stoll
Physical Review B