PublicationIEEE T-EDPaperVA-1 Measuring Barrier Heights in GaAs-AlGaAs and Metal-AlGaAs Junctions by Internal PhotoemissionIEEE T-EDView publicationAbstractNo abstract available.Home↳ PublicationsDate01 Jan 1985PublicationIEEE T-EDAuthorsM. HeiblumM.I. NathanE. EizenbergIBM-affiliated at time of publicationShare
