C.-J. Chen, Alan Lien, et al.
Journal of Applied Physics
Paper
VA-1 Measuring Barrier Heights in GaAs-AlGaAs and Metal-AlGaAs Junctions by Internal Photoemission
Abstract
No abstract available.
Related
U. Meirav, M. Heiblum, et al.
Applied Physics Letters
M. Heiblum, J. Bloch, et al.
JVSTA
M. Heiblum, M.I. Nathan, et al.
Surface Science