J. Sun, J.B. Hannon, et al.
IBM J. Res. Dev
Using low-energy electron microscopy we have found a new phase transition on the Si(001) surface at miscut angles smaller than 0.1°. The surface phase separates into facets with 300 terrace width, and regions with much larger, wavy terraces. This wavy phase is stabilized by a reduction of surface-stress-induced strain energy. A theoretical study by Tersoff and Pehlke compares favorably with our observations. © 1992 The American Physical Society.
J. Sun, J.B. Hannon, et al.
IBM J. Res. Dev
J. Jobst, E.E. Krasovskii, et al.
Physical Review B
R.M. Tromp, F. Leqoues, et al.
JVSTA
J. Tersoff, A.W. Denier Van Der Gon, et al.
Physical Review Letters