M. Copel, M.C. Reuter
Applied Physics Letters
Using low-energy electron microscopy we have found a new phase transition on the Si(001) surface at miscut angles smaller than 0.1°. The surface phase separates into facets with 300 terrace width, and regions with much larger, wavy terraces. This wavy phase is stabilized by a reduction of surface-stress-induced strain energy. A theoretical study by Tersoff and Pehlke compares favorably with our observations. © 1992 The American Physical Society.
M. Copel, M.C. Reuter
Applied Physics Letters
J.B. Hannon, R.M. Tromp
Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
M. Poppeller, E. Cartier, et al.
Microelectronic Engineering
F.M. Ross, M. Kammler, et al.
Microscopy and Microanalysis