A.W. Denier van der Gon, R.M. Tromp, et al.
Thin Solid Films
Using low-energy electron microscopy we have found a new phase transition on the Si(001) surface at miscut angles smaller than 0.1°. The surface phase separates into facets with 300 terrace width, and regions with much larger, wavy terraces. This wavy phase is stabilized by a reduction of surface-stress-induced strain energy. A theoretical study by Tersoff and Pehlke compares favorably with our observations. © 1992 The American Physical Society.
A.W. Denier van der Gon, R.M. Tromp, et al.
Thin Solid Films
R.M. Tromp, M.C. Reuter
Physical Review Letters
G.W. Rubloff, R.M. Tromp, et al.
JVSTA
G.S. Oehrlein, R.M. Tromp, et al.
JES