PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
Conference paperApplications of image diagnostics to metrology quality assurance and process controlJohn A. Allgair, Victor V. Boksha, et al.SPIE Advanced Microelectronic Manufacturing 2003
PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
