Effect of surface condition on diffusion in thin films at low temperatures
- J.C.M. Hwang
- P.S. Ho
- et al.
- 2008
- Applied Physics Letters
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4 results for J.C.M. Hwang
Grain boundary diffusion of aluminum in polycrystalline silicon films
- J.C.M. Hwang
- P.S. Ho
- et al.
- 2008
- Journal of Applied Physics
On a possible temperature dependence of the activation energy for grain boundary diffusion in metals
- J.C.M Hwang
- R.W Balluffi
- 1978
- Scripta Metallurgica
Direct observation of grain-boundary diffusion by scanning auger microscopy
- A.P. Janssen
- J.A. Venables
- et al.
- 1977
- Philosophical Magazine