Publications

86 results for Phil Oldiges

FINFET technology featuring high mobility SiGe channel for 10nm and beyond
- - Dechao Guo
  - G. Karve
  - et al.
- 2016
- VLSI Technology 2016
Toward ultimate scaling of MOSFET
- - Ramachandran Muralidhar
  - Isaac Lauer
  - et al.
- 2016
- IEEE T-ED
Vertical Slit FET at 7-nm Node and beyond
- - Ping-Lin Yang
  - Terence B. Hook
  - et al.
- 2016
- IEEE T-ED
Total ionizing dose radiation effects on 14 nm FinFET and SOI UTBB technologies
- - Harold Hughes
  - Patrick McMarr
  - et al.
- 2015
- REDW/NSREC 2015
Performance trade-offs in FinFET and gate-all-around device architectures for 7nm-node and beyond
- - Seong-Dong Kim
  - Michael Guillorn
  - et al.
- 2015
- S3S 2015
A novel ALD SiBCN low-k spacer for parasitic capacitance reduction in FinFETs
- - Tenko Yamashita
  - S. Mehta
  - et al.
- 2015
- VLSI Technology 2015
SOI FinFET soft error upset susceptibility and analysis
- - Phil Oldiges
  - Ken Rodbell
  - et al.
- 2015
- IRPS 2015
Hybrid methodology to model random dopant fluctuations in low doped FinFETs
- - Samarth Agarwal
  - Jeffrey B. Johnson
  - et al.
- 2015
- Journal of Computational Electronics
Super fast physics-based methodology for accurate memory yield prediction
- - Rajiv V. Joshi
  - Keunwoo Kim
  - et al.
- 2015
- IEEE Transactions on VLSI Systems
Metal-gate granularity-induced threshold voltage variability and mismatch in Si gate-all-around nanowire n-MOSFETs
- - Kaushik Nayak
  - Samarth Agarwal
  - et al.
- 2014
- IEEE T-ED