Absence of electrical activity at high-angle grain boundaries in zone-melt-recrystallized silicon-on-insulator films
- P.V. Evans
- D.A. Smith
- et al.
- 1992
- Applied Physics Letters
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79 results for D.A. Smith
Selection of solutes for improving electromigration resistance of metals: A new insight
- M.B. Small
- D.A. Smith
- 1992
- Applied Physics Letters
Focused ion beam imaging of grain growth in copper thin films
- J. Gupta
- J.M.E. Harper
- et al.
- 1992
- Applied Physics Letters
Comparison between the invariant line and structural ledge theories for predicting the habit plane, orientation relationship and interphase boundary structure of plate-shaped precipitates
- J.M. Howe
- D.A. Smith
- 1992
- Acta Metallurgica Et Materialia
From single defects to a structure-property relationship for polycrystals
- David A. Smith
- 1992
- Ultramicroscopy
Preparation of low resistivity Cu-1 at. %Cr thin films by magnetron sputtering
- C. Cabral
- J.M.E. Harper
- et al.
- 1992
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Calculated structures for [001] symmetrical tilt grain boundaries in silicon
- A.A. Levi
- D.A. Smith
- et al.
- 1991
- Journal of Applied Physics
In situ study of effects of ion irradiation on solid-state crystallization of cobalt disilicide thin films
- Charles W. Allen
- David A. Smith
- 1991
- Ultramicroscopy
Alternative length scales for polycrystalline materials-I. Microstructure evolution
- C.S. Nichols
- R.F. Cook
- et al.
- 1991
- Acta Metallurgica Et Materialia
Alternative length scales for polycrystalline materials-II. cluster morphology
- C.S. Nichols
- R.F. Cook
- et al.
- 1991
- Acta Metallurgica Et Materialia