A Josephson Technology System Level Experiment
- M.B. Ketchen
- B.J. van der Hoeven
- et al.
- 1981
- IEEE Electron Device Letters
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3 results for M. Natan
Geometrical effects in contact resistance measurements: Finite element modeling and experimental results
- M. Natan
- S. Purushothaman
- et al.
- 1982
- Journal of Applied Physics
Packaging Technology for Josephson Integrated Circuits
- Syamal K. Lahiri
- H. Randall Bickford
- et al.
- 1982
- IEEE Transactions on Components, Hybrids, and Manufacturing Technology