Characterization of Ni-Cr thin films by X-ray analysis
- T.C. Huang
- J.K. Howard
- 1987
- Thin Solid Films
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69 results for T.C. Huang
X-ray characterization of surface and bulk structures of sputtered iron oxide thin film
- T.C. Huang
- B.R. York
- 1987
- Applied Physics Letters
Line-broadening analysis of synchrotron x-ray diffraction data
- T.C. Huang
- M. Hart
- et al.
- 1987
- Journal of Applied Physics
Magnetic and structural properties of high rate dual ion-beam sputtered NiFe films (invited)
- Jerry Lo
- C. Hwang
- et al.
- 1987
- Journal of Applied Physics
Near-zero magnetostriction nife films deposited by ion beam sputtering
- Jerry Lo
- C. Hwang
- et al.
- 1987
- IEEE Transactions on Magnetics
X-ray structures and magnetic properties of sputtered osmium-doped iron oxide thin films
- G. Lim
- T.C. Huang
- et al.
- 1986
- Journal of Applied Physics
Optical and electrical properties of thin silver films grown under ion bombardment
- F. Parmigiani
- E. Kay
- et al.
- 1986
- Physical Review B
Interpretation of the nonbulklike optical density of thin copper films grown under ion bombardment
- F. Parmigiani
- E. Kay
- et al.
- 1985
- Applied Optics
Effect of ion bombardment during deposition on the x-ray microstructure of thin silver films
- T.C. Huang
- G. Lim
- et al.
- 1985
- JVSTA