Characterization of Non-Ohmic Behavior of Emitter Contacts of Bipolar Transistors
- B. Ricco
- J.M.C. Stork
- et al.
- 1984
- IEEE Electron Device Letters
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11 results for B. Ricco
Novel mechanism for tunneling and breakdown of thin SiO2 films
- B. Ricco
- M.Ya. Azbel
- et al.
- 1983
- Physical Review Letters
Concurrent checking of clock signal correctness
- Cecilia Metra
- Michele Favalli
- et al.
- 1998
- IEEE Design and Test of Computers
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- Bruno Ricco
- Piero Olivo
- et al.
- 1988
- IEEE T-ED
High-Field-Induced Degradation in Ultra-Thin SiO2 Films
- Piero Olivo
- Thao N. Nguyen
- et al.
- 1988
- IEEE T-ED
Evidence of the role of defects near the injecting interface in determining SiO2 breakdown
- P. Olivo
- B. Ricco
- et al.
- 1987
- Applied Physics Letters
Hot-electron-induced defects at the Si-SiO2 interface at high fields at 295 and 77 K
- M.V. Fischetti
- B. Riccó
- 1985
- Journal of Applied Physics
Resonant tunneling of holes in AlAs-GaAs-AlAs heterostructures
- E. Mendez
- W.I. Wang
- et al.
- 1985
- Applied Physics Letters
Temperature dependence of the current in SiO2 in the high field tunneling regime
- B. Ricco
- M.V. Fischetti
- 1984
- Journal of Applied Physics
Tunneling through a multiwell one-dimensional structure
- B. Ricco
- M.Ya. Azbel
- 1984
- Physical Review B