SLS - A fast switch level simulator for verification and fault coverage analysis
- Z. Barzilai
- D. Beece
- et al.
- 1986
- DAC 1986
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14 results for Leendert M. Huisman
Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
Symbolic implication in test generation
- Sandip Kundu
- I. Nair
- et al.
- 1992
- European Conference on Design Automation 1992
A small test generator for large designs
- Sandip Kundu
- Leendert M. Huisman
- et al.
- 1992
- IEEE ITC 1992
Fault simulation of logic designs on parallel processors with distributed memory
- Leendert M. Huisman
- Raja Daoud
- 1990
- IEEE ITC 1990
Fault simulation on message passing
- Leendert M. Huisman
- Raja Daoud
- et al.
- 1990
- DMCC 1990
RANDOM PATTERN TESTING OF LOGIC SURROUNDING EMBEDDED RAMS USING PERTURBATION ANALYSIS.
- Leendert M. Huisman
- 1985
- ICCD 1985
TRIM: TESTABILITY RANGE BY IGNORING THE MEMORY.
- Larry Carter
- Leendert M. Huisman
- et al.
- 1985
- IEEE ITC 1985
Yield fluctuations and defect models
- Leendert M. Huisman
- 1995
- Journal of Electronic Testing
Highly Reliable Symmetric Networks
- Leendert M. Huisman
- Sandip Kundu
- 1994
- IEEE TPDS