TRIM: TESTABILITY RANGE BY IGNORING THE MEMORY.
- Larry Carter
- Leendert M. Huisman
- et al.
- 1985
- IEEE ITC 1985
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14 results for Leendert M. Huisman
RANDOM PATTERN TESTING OF LOGIC SURROUNDING EMBEDDED RAMS USING PERTURBATION ANALYSIS.
- Leendert M. Huisman
- 1985
- ICCD 1985
SLS - A fast switch level simulator for verification and fault coverage analysis
- Z. Barzilai
- D. Beece
- et al.
- 1986
- DAC 1986
Fast Pass-Transistor Simulation for Custom MOS Circuits
- Zeev Barzilai
- Leendert M. Huisman
- et al.
- 1984
- IEEE Design and Test of Computers