Simulation of embedded memories by defective hashing
- Leendert M. Huisman
- 1990
- IBM J. Res. Dev
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14 results for Leendert M. Huisman
The reliability of approximate testabilty measures
- Leendert M. Huisman
- 1988
- IEEE Design and Test of Computers
TRIM: Testability Range by Ignoring the Memory
- Larry Carter
- Leendert M. Huisman
- et al.
- 1988
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Fast Pass-Transistor Simulation for Custom MOS Circuits
- Zeev Barzilai
- Leendert M. Huisman
- et al.
- 1984
- IEEE Design and Test of Computers