Process Damage and Contamination Effects for Shallow Si Implanted GaAs
- H. Baratte
- A.J. Fleischman
- et al.
- 2019
- JES
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73 results for G. Scilla
MnFe and NiFe Thin Films and Magnetic Exchange Bilayers
- Michael A. Russak
- S.M. Rossnagel
- et al.
- 2019
- JES
Dependence on the NiP Surface Treatment
- Doreen DiMilia
- Jean Horkans
- et al.
- 2019
- JES
Surface Modifications of Electronic Materials Induced by Plasma Etching
- G.S. Oehrlein
- S.W. Robey
- et al.
- 2019
- JES
Epitaxial Growth of GaAs with (C2H5)2GaCl and AsH3 in a Hotwall Reactor
- T.F. Kuech
- M.A. Tischler
- et al.
- 2019
- JES
Surface composition of polystyrene
- Ronald D. Goldblatt
- Gerald J. Scilla
- et al.
- 2003
- Journal of Applied Polymer Science
Time-of-Flight Static SIMS Study of Imidization in Pyromellitic Dianhydride-4,4′-Oxydianiline Polyimide Films
- B.N. Eldridge
- C. Feger
- et al.
- 2002
- Macromolecules
Application of a CF3+Primary Ion Source for Depth Profiling in Secondary Ion Mass Spectrometry
- Wilhad Reuter
- Gerald J. Scilla
- 2002
- Analytical Chemistry
Preparation and in-situ surface analysis of MNFE/NIFE exchange structures: interfacial impurity incorporation
- Susan L. Choen
- John M. Baker
- et al.
- 1993
- MRS Spring Meeting 1993
Wittmer et al. reply
- M. Wittmer
- P. Fahey
- et al.
- 1993
- Physical Review Letters