The study of the Cu/Al/Au thin film system by electron microscopy
- P.J. Bailey
- P.B. Madakson
- 1991
- Scanning
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16 results for P.B. Madakson
Correlation between resistivity and diffusion in thin films
- Peter Madakson
- 1991
- Journal of Applied Physics
Interdiffusion, hardness and resistivity of Cr/Cu/Co/Au thin films
- Peter Madakson
- 1991
- Journal of Applied Physics
Interdiffusion and resistivity of Cu/Au, Cu/Co, Co/Au, and Cu/Co/Au thin films at 25-550°C
- Peter Madakson
- Joyce C. Liu
- 1990
- Journal of Applied Physics
Analysis of buried GaAs layers in 〈100〉 silicon by electron energy loss spectroscopy, Rutherford backscattering spectroscopy, and ion channeling
- Peter Madakson
- John Bruley
- 1990
- Applied Physics Letters
Effects of C+ implantation on the interdiffusion and resistivity of Cu/Ni/Au thin films
- Peter Madakson
- J. Karasinski
- 1990
- Journal of Applied Physics
As+ and Ga+ implantation and the formation of buried GaAs layers in silicon
- Peter Madakson
- Eti Ganin
- et al.
- 1990
- Journal of Applied Physics
RBS analysis of Si diffusion in photoresist during silylation
- P.B. Madakson
- S. Nunes
- et al.
- 1990
- Nuclear Inst. and Methods in Physics Research, B
Characterization of CVD-hydrogenated diamondlike thin films on silicon by EELS, RBS/channeling and nuclear reaction analysis
- J. Bruley
- P.B. Madakson
- et al.
- 1990
- Nuclear Inst. and Methods in Physics Research, B
Processing of La1.8Sr0.2CuO4 and YBa 2Cu3O7 superconducting thin films by dual-ion-beam sputtering
- P.B. Madakson
- J.J. Cuomo
- et al.
- 1988
- Journal of Applied Physics