Microstructure of epitaxial Ag/Si(111) and Ag/Si(100) interfaces
- F. Legoues
- M. Liehr
- et al.
- 2006
- Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
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4 results for M. Renier
Summary Abstract’ Integrated system for studies of thln-film chemical growth processes on silicon wafers
- M. Liehr
- S. Gates
- et al.
- 1987
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Electrical properties of vacuum annealed Si surfaces
- J. Werner
- M. Renier
- et al.
- 1987
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Dopant redistribution at Si surfaces during vacuum anneal
- M. Liehr
- M. Renier
- et al.
- 1987
- Journal of Applied Physics