Automatic defect classification for integrated circuits
- Paul B. Chou
- A. ILao Ravishankar
- et al.
- 1993
- IS&T/SPIE Electronic Imaging 1993
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9 results for Virginia H. Brecher
Calibration, set-up and performance evaluation in an IC inspection system
- B. Dom
- Virginia H. Brecher
- 1992
- IS&T/SPIE Electronic Imaging 1992
Recent advances in inspecting integrated circuits for pattern defects
- Virginia H. Brecher
- B. Dom
- 1992
- IS&T/SPIE Electronic Imaging 1992
New techniques for patterned wafer inspection based on a model of human preattentive vision
- Virginia H. Brecher
- 1992
- SPIE Aerospace Sensing 1992
Model of human preattentive visual detection of edge orientation anomalies
- Virginia H. Brecher
- Raymond Bonner
- et al.
- 1991
- SPIE Orlando 1991
The P300: An approach to automated inspection of patterned wafers
- Virginia Brecher
- Raymond Bonner
- et al.
- 1989
- Proceedings of SPIE 1989
Automatic defect classification for semiconductor manufacturing
- Paul B. Chou
- A. Ravishankar Rao
- et al.
- 1996
- Machine Vision and Applications
Recent advances in the automatic inspection of integrated circuits for pattern defects
- Byron E. Dom
- Virginia Brecher
- 1995
- Machine Vision and Applications
The P300: A system for automatic patterned wafer inspection
- Byron E. Dom
- Virginia H. Brecher
- et al.
- 1988
- Machine Vision and Applications