Electrostatic Writing and Imaging Using a Force Microscope
- Frank Saurenbach
- Bruce D. Terris
- 1992
- IEEE Transactions on Industry Applications
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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87 results for B.D. Terris
Charge spectrometer for mono- and dual-component toner
- B.D. Terris
- K.J. Fowler
- 1991
- Journal of imaging technology
Imaging of ferroelectric domain walls by force microscopy
- F. Saurenbach
- B.D. Terris
- 1990
- Applied Physics Letters
Localized charge force microscopy
- B.D. Terris
- J.E. Stern
- et al.
- 1990
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Deposition and imaging of localized charge on insulator surfaces using a force microscope
- J.E. Stern
- B.D. Terris
- et al.
- 1988
- Applied Physics Letters
Force microscope using a fiber-optic displacement sensor
- D. Rugar
- H.J. Mamin
- et al.
- 1988
- Review of Scientific Instruments
Force microscopy of magnetization patterns in longitudinal recording media
- H.J. Mamin
- D. Rugar
- et al.
- 1988
- Applied Physics Letters