Copper Corrosion with and without Inhibitors
- V. Brusic
- M.A. Frisch
- et al.
- 2019
- JES
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4 results for F. Novak
A time-of-flight static secondary ion mass spectrometry and X-ray photoelectron spectroscopy study of 3-aminopropyltrihydroxysilane on water plasma treated chromium and silicon surfaces
- B.N. Eldridge
- L.P. Buchwalter
- et al.
- 1992
- Journal of Adhesion Science and Technology
Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry
- A. Wucher
- H. Oechsner
- et al.
- 1989
- Thin Solid Films
Relative elemental sensitivity factors in secondary neutral mass spectrometry
- A. Wucher
- F. Novak
- et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films