Interface traps induced by hole trapping in metal-oxide semiconductor devices
- Y. Roh
- L.P. Trombetta
- et al.
- 1995
- Journal of Non-Crystalline Solids
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3 results for L.P. Trombetta
New model of a common origin for trapped holes and anomalous positive charge in MOS capacitors
- Y. Roh
- L.P. Trombetta
- et al.
- 1993
- Microelectronic Engineering
An electron paramagnetic resonance study of electron injected oxides in metal-oxide-semiconductor capacitors
- L.P. Trombetta
- G.J. Gerardi
- et al.
- 1988
- Journal of Applied Physics