Interface traps induced by hole trapping in metal-oxide semiconductor devices
- Y. Roh
- L.P. Trombetta
- et al.
- 1995
- Journal of Non-Crystalline Solids
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
Date
Featured collections
Popular topics
3 results for L.P. Trombetta
New model of a common origin for trapped holes and anomalous positive charge in MOS capacitors
- Y. Roh
- L.P. Trombetta
- et al.
- 1993
- Microelectronic Engineering
An electron paramagnetic resonance study of electron injected oxides in metal-oxide-semiconductor capacitors
- L.P. Trombetta
- G.J. Gerardi
- et al.
- 1988
- Journal of Applied Physics