Publications

2 results for D.O. Welch

Microvoids and defect chemistry at the SiSiO₂ interface studied by positron annihilation depth profiling
- - G.W Rubloff
  - B Nielsen
  - et al.
- 1990
- Vacuum
Microvoids at the SiO2/Si interface
- - Bent Nielsen
  - K.G. Lynn
  - et al.
- 1989
- Physical Review B