Direct determination of impact-ionization rates near threshold in semiconductors using soft-x-ray photoemission
- E.A. Eklund
- P.D. Kirchner
- et al.
- 1992
- Physical Review Letters
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9 results for D.K. Shuh
Atomic layer epitaxy of silicon by dichlorosilane studied with core level spectroscopy
- J.A. Yarmoff
- D.K. Shuh
- et al.
- 1992
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Stoichiometry reversal and depth-profiling in the growth of thin oxynitride films with N2O on Si(100) surfaces
- D.G.J. Sutherland
- H. Akatsu
- et al.
- 1996
- Journal of Electron Spectroscopy and Related Phenomena
First experimental results from IBM/TENN/TULANE/LLNL/LBL undulator beamline at the advanced light source
- J.J. Jia
- T.A. Callcott
- et al.
- 1995
- Review of Scientific Instruments
Stoichiometry reversal in the growth of thin oxynitride films on Si(100) surfaces
- D.G.J. Sutherland
- H. Akatsu
- et al.
- 1995
- Journal of Applied Physics
Chlorine chemisorption on and the onset of etching of cleaved GaAs(110) at room temperature
- D.K. Shuh
- C.W. Lo
- et al.
- 1994
- Surface Science
Occupied and unoccupied orbitals of c60 and c70
- J.A. Carlisle
- L.J. Terminello
- et al.
- 1994
- Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals
Initial stages of atomic hydrogen chemisorption on GaAs(110): a high resolution photoemission study
- A. Santoni
- L. Sorba
- et al.
- 1992
- Surface Science
Unfilled orbitals of C60 and C70 from carbon K-shell X-ray absorption fine structure
- L.J. Terminello
- D.K. Shuh
- et al.
- 1991
- Chemical Physics Letters