Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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4 results for J.W. Weijtmans

High-performance nMOSFET with in-situ phosphorus-doped embedded Si:C (ISPD eSi:C) source-drain stressor
- - B. Yang
  - R. Takalkar
  - et al.
- 2008
- IEDM 2008
Effect of ion implantation and anneals on fully-strained SiC and SiC:P films using multiple characterization techniques
- - A. Madan
  - J. Li
  - et al.
- 2008
- ECS Meeting 2008
Recent progress and challenges in enabling embedded Si:C technology
- - B. Yang
  - Z. Ren
  - et al.
- 2008
- ECS Meeting 2008
On implementation of embedded Phosphorus-doped SiC stressors in SOI nMOSFETs
- - Zhibin Ren
  - G. Pei
  - et al.
- 2008
- VLSI Technology 2008