IC failure mechanisms yesterday, today, tomorrow: Implications from test to DFM
- Anne Gattiker
- 2006
- ISPD 2006
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25 results for Anne Gattiker
Defects yesterday, today and tomorrow: Implications for test
- Anne Gattiker
- 2006
- DBT 2006
Photon emission microscopy of inter/intra chip device performance variations
- S. Polonsky
- M. Bhushan
- et al.
- 2005
- ESREF 2005
Diagnosis meets physical failure analysis: How long can we succeed?
- Anne Gattiker
- 2004
- IEEE ITC 2004
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- Phil Nigh
- Anne Gattiker
- 2004
- IEEE ITC 2004
Test Structures for Delay Variability
- Duane Boning
- Joseph Panganiban
- et al.
- 2002
- TAU 2002
Power supply transient signal analysis under real process and test hardware models
- A. Singh
- J. Plusquellic
- et al.
- 2002
- VTS 2002
Timing yield estimation from static timing analysis
- Anne Gattiker
- Sani Nassif
- et al.
- 2001
- ISQED 2001
Current-Signature-Based Analysis of Complex Test Fails
- Anne Gattiker
- Phil Nigh
- et al.
- 1999
- ISTFA 1999
Accelerating Conversational Agents Built with Off-the-Shelf Modularized Services
- Jinho Lee
- Inseok Hwang
- et al.
- 2019
- IEEE Pervasive Computing