Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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25 results for Anne Gattiker

IC failure mechanisms yesterday, today, tomorrow: Implications from test to DFM
- - Anne Gattiker
- 2006
- ISPD 2006
Defects yesterday, today and tomorrow: Implications for test
- - Anne Gattiker
- 2006
- DBT 2006
Photon emission microscopy of inter/intra chip device performance variations
- - S. Polonsky
  - M. Bhushan
  - et al.
- 2005
- ESREF 2005
Diagnosis meets physical failure analysis: How long can we succeed?
- - Anne Gattiker
- 2004
- IEEE ITC 2004
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- - Phil Nigh
  - Anne Gattiker
- 2004
- IEEE ITC 2004
Test Structures for Delay Variability
- - Duane Boning
  - Joseph Panganiban
  - et al.
- 2002
- TAU 2002
Power supply transient signal analysis under real process and test hardware models
- - A. Singh
  - J. Plusquellic
  - et al.
- 2002
- VTS 2002
Timing yield estimation from static timing analysis
- - Anne Gattiker
  - Sani Nassif
  - et al.
- 2001
- ISQED 2001
Current-Signature-Based Analysis of Complex Test Fails
- - Anne Gattiker
  - Phil Nigh
  - et al.
- 1999
- ISTFA 1999
Accelerating Conversational Agents Built with Off-the-Shelf Modularized Services
- - Jinho Lee
  - Inseok Hwang
  - et al.
- 2019
- IEEE Pervasive Computing