Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions

Phil Nigh; Anne Gattiker

IEEE ITC 2004

Conference paper

01 Dec 2004

Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions

Abstract

This paper demonstrates IDDQ signature analysis of random and systematic defects, including yield detractors and reliability defects. Application is demonstrated for both understanding failure root cause and guiding test decisions.

Conference paper

Diagnosis meets physical failure analysis: How long can we succeed?

Anne Gattiker

IEEE ITC 2004

Conference paper

Modeling UpLink power control with outage probabilities

Kenneth L. Clarkson, K. Georg Hampel, et al.

VTC Spring 2007

Paper

Multi-scale feature fusion quantum depthwise Convolutional Neural Networks for text classification

Yixiong Chen, Weichuan Fang

Engineering Analysis with Boundary Elements

Conference paper

CMOS IC diagnostics using the luminescence of OFF-state leakage currents

Stas Polonsky, Keith A. Jenkins, et al.

IEEE ITC 2004

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Abstract

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Diagnosis meets physical failure analysis: How long can we succeed?

Modeling UpLink power control with outage probabilities

Multi-scale feature fusion quantum depthwise Convolutional Neural Networks for text classification

CMOS IC diagnostics using the luminescence of OFF-state leakage currents