Publications

2 results for H. Kimura

RTA-driven intra-die variations in stage delay, and parametric sensitivities for 65nm technology
- - I. Ahsan
  - N. Zamdmer
  - et al.
- 2006
- VLSI Technology 2006
Body voltage and history effect sensitivity to key device parameters in 90nm PD-SOI
- - S. Kawanaka
  - M.B. Ketchen
  - et al.
- 2004
- IEEE International SOI Conference 2004