CMOS mixed-signal circuit process variation sensitivity characterization for yield improvement
- Daeik Kim
- Ongyeun Cho
- et al.
- 2006
- CICC 2006
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Decomposition and analysis of process variability using constrained principal component analysis
- Ongyeun Cho
- Daeik D. Kim
- et al.
- 2008
- IEEE Trans Semicond Manuf