Trade-offs between RF performance and total-dose tolerance in 45-nm RF-CMOS
- Rajan Arora
- En Xia Zhang
- et al.
- 2011
- IEEE TNS
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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12 results for Giuseppe La Rosa
The energy-driven paradigm of NMOSFET hot-carrier effects
- Stewart E. Rauch Iii
- Giuseppe La Rosa
- 2005
- IEEE T-DMR