Is product screen enough to guarantee low failure rate for the customer?
- M.W. Ruprecht
- G. La Rosa
- et al.
- 2001
- IRPS 2001
Publications
Date
Featured collections
Popular topics
12 results for Giuseppe La Rosa
NBTI-Channel Hot Carrier effects in pMOSFETs in advanced CMOS technologies
- G. La Rosa
- F. Guarin
- et al.
- 1997
- IRPS 1997