Yield learning methodologies and failure isolation in ring oscillator circuit for CMOS technology research
- Victor Chan
- Kangguo Cheng
- et al.
- 2019
- IEEE Trans Semicond Manuf
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14 results for G. Karve
Study of TiN and TaN underlayer properties and their influence on W growth
- Shanti Pancharatnam
- Gabriel Rodriguez
- et al.
- 2019
- IEEE Trans Semicond Manuf
Origin of dark counts in In 0.53 Ga 0.47As/In 0.52Al 0.48As avalanche photodiodes operated in Geiger mode
- G. Karve
- S. Wang
- et al.
- 2005
- Applied Physics Letters
Geiger mode operation of an In0.53Ga0.47As-In0.52Al0.48As avalanche photodiode
- Gauri Karve
- Xiaoguang Zheng
- et al.
- 2003
- IEEE JQE