Improving the power-performance of multicore processors through optimization of lithography and thermal processing
- A. Gabor
- T.A. Brunner
- et al.
- 2007
- SPIE Advanced Lithography 2007
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3 results for D. Onsongo
Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs
- D.Q. Kelly
- S. Dey
- et al.
- 2005
- Microelectronics Reliability
Improved hot-electron reliability in strained-Si nMOS
- David Onsongo
- David Q. Kelly
- et al.
- 2004
- IEEE Transactions on Electron Devices