Losses caused by roughness of metallization in printed-circuit boards
- A. Deutsch
- C. Surovic
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
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6 results for Bruce J. Chamberlin
Comparison of time- and frequency domain measurement results for product related card and MCM transmission lines up to 65 GHz
- Thomas-Michael Winkel
- A. Deutsch
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005
Extraction of ε(f) and tan δ(f) for BT Insulator up to 30 GHz Using the Short-Pulse Propagation Technique
- A. Deutsch
- T.-M. Winkel
- et al.
- 2003
- IEEE Topical Meeting EPEPS 2003
Accuracy of dielectric constant measurement using the full-sheet-resonance technique IPC-TM-650 2.5.5.6
- A. Deutsch
- A. Huber
- et al.
- 2002
- IEEE Topical Meeting EPEPS 2002
Prediction of losses caused by roughness of metallization in printed-circuit boards
- Alina Deutsch
- Christopher W. Surovic
- et al.
- 2007
- IEEE Transactions on Advanced Packaging
Extraction of εr(f) and tan δ(f) for printed circuit board insulators up to 30 GHz using the short-pulse propagation technique
- Alina Deutsch
- Thomas-Michael Winkel
- et al.
- 2005
- IEEE Transactions on Advanced Packaging