Alan Gara, Matthias A. Blumrich, et al.
IBM J. Res. Dev
In this paper, the self-consistent, frequency-dependent dielectric constant ε"r(f) and dielectric loss tan δ(f) of several materials are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. The simple measurement technique is performed in the time domain on representative printed circuit board wiring. Broadband, fully causal transmission-line models based on these results are generated up to 50 GHz for card wiring using low loss materials including BT, Nelco N4000-13, and Nelco N4000-13SI. Simulation and modeling results highlight the need for the accurate frequency-dependent dielectric loss extraction. Signal propagation based on these results shows very good agreement with measured step and pulse time-do-main excitations and provides validation of the measurement and model generation technique. © 2005 IEEE.
Alan Gara, Matthias A. Blumrich, et al.
IBM J. Res. Dev
Alina Deutsch, Roger S. Krabbenhoft, et al.
IEEE Trans Electromagn Compat
Nickolas J. Mazzeo, Ian L. Sanders, et al.
IEEE Transactions on Magnetics
Yulei Zhang, Xiang Hu, et al.
SLIP 2009