All-in-one static and dynamic nanostencil atomic force microscopy/scanning tunneling microscopy system
- Percy Zahl
- Martin Bammerlin
- et al.
- 2005
- Review of Scientific Instruments
Publications
8 results for Martin Bammerlin
Micro-four-point-probe characterization of nanowires fabricated using the nanostencil technique
- R. Lin
- M. Bammerlin
- et al.
- 2004
- Nanotechnology
Direct Determination of the Energy Required to Operate a Single Molecule Switch
- Ch. Loppacher
- M. Guggisberg
- et al.
- 2003
- Physical Review Letters
Direct determination of the energy required to operate a single molecule switch
- Ch. Loppacher
- M. Guggisberg
- et al.
- 2003
- Physical Review Letters
Forces with submolecular resolution between the probing tip and Cu-TBPP molecules on Cu(100) observed with a combined AFM/STM
- Ch. Loppacher
- M. Bammerlin
- et al.
- 2001
- Applied Physics A: Materials Science and Processing
Dynamic SFMwith true atomic resolution on alkali halide surfaces
- M. Bammerlin
- R. Lüthi
- et al.
- 1998
- Applied Physics A: Materials Science and Processing
Ultrahigh vacuum atomic force microscopy: True atomic resolution
- R. Lüthi
- E. Meyer
- et al.
- 1997
- Surface Review and Letters
Atomic resolution in dynamic force microscopy across steps on Si(111)7 × 7
- R. Lüthi
- E. Meyer
- et al.
- 1996
- Zeitschrift fur Physik B-Condensed Matter