Low temperature scanning force microscopy of the si(111)-(7×7) surface
- M.A. Lantz
- H.J. Hug
- et al.
- 2000
- Physical Review Letters
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7 results for S. Martin
Ultra-small single-crystal silicon cantilevers for scanning force microscopes
- J.L. Yang
- M. Despont
- et al.
- 2004
- MEMS 2004
Miniaturized single-crystal silicon cantilevers for scanning force microscopy
- J.L. Yang
- M. Despont
- et al.
- 2005
- Applied Physics Letters
A Fabry-Perot interferometer for micrometer-sized cantilevers
- B.W. Hoogenboom
- P.L.T.M. Frederix
- et al.
- 2005
- Applied Physics Letters
Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111)7×7 surface
- A. Lantz
- J. Hug
- et al.
- 2003
- Physical Review B - CMMP
Short-range electrostatic interactions in atomic-resolution scanning force microscopy on the Si(111) 7×7 surface
- M.A. Lantz
- H.J. Hug
- et al.
- 2003
- Physical Review B - CMMP
Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy
- R. Hoffmann
- M.A. Lantz
- et al.
- 2003
- Physical Review B - CMMP