S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Atomically resolved scanning force microscopy images and force versus distance measurements at low temperatures on a cleaved NiO (001) single crystal are reported. The force-distance data are well modeled with a capacitive force in the distance range of 0.5 to 20 nm. The residual forces at smaller tip-sample distances show a maximum attraction of 2.3 nN and decay within 0.2 nm. They show a steplike behavior associated with an increase in dissipation signal. This steplike behavior can be explained by interaction of more than one atom of the tip or of the surface. © 2003 The American Physical Society.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A. Krol, C.J. Sher, et al.
Surface Science
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT