Publications

3 results for Tian Xia

CMOS IC diagnostics using the light emission from off-state leakage currents (LEOSLC)
- - Peilin Song
  - Stas Polonsky
  - et al.
- 2005
- Electronic Device Failure Analysis
Broken scan chain diagnostics based on time-integrated and time-dependent emission measurements
- - Franco Stellari
  - Peilln Song
  - et al.
- 2004
- ISTFA 2004
A novel scan chain diagnostics technique based on light emission from leakage current
- - Peilin Song
  - Franco Stellari
  - et al.
- 2004
- IEEE ITC 2004