32nm CMOS SOI test site for emission tool evaluation
Alan J. Weger, Franco Stellari, et al.
ISTFA 2013
Light emission due to off-state leakage current (LEOSLC) has become an intense source of light, comparable to hot carrier emission, making it a useful method for testing chips. Increase in leakage current and voltage difference increases the LEOSLC, which enables the detection of voltage, temperature variations, and the logic state of the gates. This method provides a very high resolution, and is especially useful when diagnosing a fault that resides in a scan clock tree, which is hard to diagnose using conventional method. The application of this method in diagnostics could become easier and more frequent as the leakage becomes larger with the evolving technologies.
Alan J. Weger, Franco Stellari, et al.
ISTFA 2013
Franco Stellari, Peilin Song
IPFA 2005
Stas Polonsky, Keith A. Jenkins
ISDRS 2003
Franco Stellari, Ernest Y. Wu, et al.
Microelectronics Reliability