Low temperature scanning force microscopy of the si(111)-(7×7) surface
- M.A. Lantz
- H.J. Hug
- et al.
- 2000
- Physical Review Letters
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2 results for P.J.A. van Schendel
Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy
- R. Hoffmann
- M.A. Lantz
- et al.
- 2003
- Physical Review B - CMMP