Observation of change in the oxidation state at ferromagnet/insulator interface upon thermal annealing
- L. Seve
- W. Zhu
- et al.
- 2001
- Europhysics Letters
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3 results for W. Zhu
Field cooling induced changes in the antiferromagnetic structure of NiO films
- W. Zhu
- L. Seve
- et al.
- 2001
- Physical Review Letters
Determination of the thickness of Al oxide films used as barriers in magnetic tunneling junctions
- W. Zhu
- C.J. Hirschmugl
- et al.
- 2001
- Applied Physics Letters