Enhanced secondary electron yield from oxidized regions on amorphous carbon films studied by x-ray spectromicroscopy
- Javier Diaz
- Simone Anders
- et al.
- 1999
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.