Publications

This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.

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92 results for Franco Stellari

Current crowding in faulty MOSFET: Optical and electrical investigation
- - A. Tosi
  - F. Stellari
  - et al.
- 2004
- Microelectronics Reliability
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Model-based guidelines to suppress cable discharge event (CDE) induced latchup in CMOS ICs
- - K. Chatty
  - P.E. Cottrell
  - et al.
- 2004
- IRPS 2004
Time-resolved emission testing challenges for low voltage CMOS technologies
- - Peilin Song
  - Franco Stellari
  - et al.
- 2003
- LEOS 2003
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- IEEE ITC 2003
Time-Resolved Optical Measurements from 0.13μm CMOS Technology Microprocessor using a Superconducting Single-Photon Detector
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- ISTFA 2003
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- ISTFA 2003
Hot-carrier luminescence: Comparison of different CMOS technologies
- - Alberto Tosi
  - Franco Stellari
  - et al.
- 2003
- ESSDERC 2003
Latchup Analysis Using Emission Microscopy
- - Franco Stellari
  - Peilin Song
  - et al.
- 2003
- Microelectronics Reliability
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- - Alan Weger
  - Steven Voldman
  - et al.
- 2003
- IRPS 2003