Mapping and statistical analysis of filaments locations in amorphous HfO2 ReRAM cells
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2023
- Microelectronics Reliability
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95 results for Peilin Song
Securing SoCs with FPGAs Against Rowhammer Attacks
- Rana Elnaggar
- Siyuan Chen
- et al.
- 2022
- IEEE TCADIS
Gibbs spatial process for characterization of filament interaction in ReRAM devices via photon emission microscopy
- Ernest Wu
- Franco Stellari
- et al.
- 2022
- Applied Physics Letters
AC conductivity analysis as a measure of low k dielectric capacitor reliability degradation due to moisture ingress
- Cyril Cabral
- Robert B. Laibowitz
- et al.
- 2020
- Microelectronic Engineering
Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2016
- Electronic Device Failure Analysis
Self-Heating Measurement of 14-nm FinFET SOI Transistors Using 2-D Time-Resolved Emission
- Franco Stellari
- Keith A. Jenkins
- et al.
- 2016
- IEEE T-ED
Performance degradation analysis and hot-carrier injection impact on the lifetime prediction of LC voltage control oscillator
- Chih-Hsiang Ho
- Keith A. Jenkins
- et al.
- 2015
- IEEE T-ED
Automated high-resolution imaging of very large fields of view (FOV)
- Franco Stellari
- Chung Ching Lin
- et al.
- 2015
- Electronic Device Failure Analysis
Single photon detectors for ultra low voltage time-resolved emission measurements
- Franco Stellari
- Peilin Song
- et al.
- 2011
- IEEE JQE
Characterization of random process variations using ultralow-power, high-sensitivity, bias-free sub-threshold process sensor
- Mesut Meterelliyoz
- Peilin Song
- et al.
- 2010
- IEEE TCAS-I