Franco Stellari, Peilin Song
ISTFA 2012
The I/O interface latchup analysis using optical and electrical testing was discussed. JEDEC78 testing procedure, an automated computer-controlled latchup test program, was developed for the analysis. Emission of microscopy was used to characterize the ignition and diffusion of latchup in a series of I/O pins of a test chip. The results show that minority carriers can diffuse underneath lines of decoupling capacitances, if the recombination length of the minority carriers is comparable with the size of the capacitance.
Franco Stellari, Peilin Song
ISTFA 2012
Peilin Song, Stephen Ippolito, et al.
IEEE ITC 2008
Peilin Song, Franco Stellari, et al.
IEEE ITC 2014
Franco Stellari, Ernest Y. Wu, et al.
IEEE Electron Device Letters